XRUS-G10

Resonant ultrasound spectrometer with the function of characterizing piezoelectric crystals

XRUS-G10 Features

Easy to operate

Characterization of all elastic and piezoelectric constants of piezoelectric crystals with a single sample

Feature-rich software with user-friendly interface and pre-set material parameters for a wide range of materials

Revolutionary innovation

Resonant ultrasound spectrometer with the function of characterizing piezoelectric crystals

Characterization of multiple sample types

Characterization of all elastic constants of alloys, rocks, and other solids with a single sample

Non-destructive testing of cracks in solid parts (ASTM International Standard E2001-18)

High and low temperature tests

In combination with our high-temperature ultrasonic transducers, the temperature dependence of the elastic and piezoelectric constants of piezoelectric crystals can be characterized

Characterization of the temperature dependence of the elastic constants of alloys and ceramics

XRUS-G10 Parameters

Bandwidth: 50 kHz–3 MHz

Maximum Output: 90 Vp–p @ 1 MHz

Piezoelectric crystals which can be characterized*: 32, 422, 3m, 4mm, 6mm, mm2 (others can be customized)

Solid samples without piezoelectricity which can be characterized: Customizable for all types

Temperature range: RT, -20°C–40°C; AT, -20°C–200°C (equipped with high-temperature transducers, fixtures and environmental chamber)

Operating System: Windows 7 x64 and higher, Ubuntu x64 22.04

Note:

  • 32: LGS, LGT, etc.
  • 422: α-FeO2, etc.
  • 3m: LiNbO3, [111]c poled relaxor based single crystals, etc.
  • 4mm: [001]c poled relaxor based single crystals, etc.
  • 6mm: BaTiO3, Bi4Ti3O12, PZT, etc.
  • mm2: [011]c poled relaxor based single crystals, etc.

Application Case I Application Case II Application Case III Application Case IV

Characterization of [111]c poled PIN-PMN-PT single crystals

A. L. Xiao, L. G. Tang*, G. S. Xu*, K. C. Wu, W. Y. Luo, Temperature-dependent characterization of full tensor properties of [111]c poled Mn-doped 28PIN-43PMN-29PT single crystals, Applied Physics Letters, 124, 212901, 2024.

Application Case I Application Case II Application Case III Application Case IV

Characterization of [001]c poled PIN-PMN-PT single crystals

L. G. Tang*, H. Tian, Y. Zhang, and W. W. Cao*, Temperature dependence of dielectric, elastic, and piezoelectric constants of [001]c poled Mn-doped 0.24Pb(In1/2Nb1/2)O3-0.46Pb(Mg1/3Nb2/3)O3-0.30PbTiO3 single crystal, Applied Physics Letters, 108(8): 082901, 2016.

Application Case I Application Case II Application Case III Application Case IV

Non-destructive testing for lithium batteries

Patent: A device and method for detecting lithium battery based on resonant ultrasound spectroscopy, Liguo Tang, Shujia Wang, Shaofei Wang, Jiahe Zang

Application Case I Application Case II Application Case III Application Case IV

Characterization of material constants of LGT crystals under high-temperature

High-temperature Resonant Ultrasound Spectroscopy system

Resonance ultrasonic spectra of LGT crystal samples at 20°C and 400°C

Elastic and piezoelectric constants of LGT single crystals Characterized Using RUS
Temperature
(°C)
Elastic Constants
cE ij (1010 N/m2)
Piezoelectric Constants
eij (C/m2)
cE 11 cE 12 cE 13 cE 14 cE 33 cE 44 e11 e14
20 18.586 10.524 9.785 1.353 26.003 5.093 -0.439 0.123
400 18.346 10.314 9.694 1.256 25.340 5.056 -0.429 0.209

Founded in December 2023, AcoustEvol Technology Co., Ltd. specializes in the research, development and production of high-tech material characterization instruments and ancillary facilities.

We have successfully developed the commercialized resonant ultrasound spectrometer (XRUS-G10), which is easy to use, with rich functions of the supporting software, and a wide range of materials to be characterized. Especially, XRUS-G10 has the function of characterizing the elastic and piezoelectric constants of piezoelectric materials.

The XRUS-G10 series of resonant ultrasound spectrometers only needs a single sample to realize the characterization of all the elasticity and piezoelectric constants of piezoelectric crystals, which is significantly more efficient than the electric resonance technique recommended by IEEE Piezoelectricity Standard. Combined with our self-developed high-temperature resistant ultrasonic transducers (200°C), the instrument can efficiently and accurately characterize the temperature-dependent properties of the elastic and piezoelectric constants of piezoelectric materials.

In addition to the characterization of piezoelectric materials, the XRUS-G10 series of resonant ultrasound spectrometers can also be used to accurately characterize the temperature-dependent elastic constants of alloys, rocks, functional ceramics and single crystals. It can also be used for non-destructive testing of internal defects in solid components.