High and low temperature resonant ultrasound spectrometer_Resonant ultrasound spectrometer_Products

High and low temperature resonant ultrasound spectrometer

Bandwidth: 20kHz–4MHz
Maximum output voltage: 90 Vp-p @ 1 MHz
Temperature range: Room temperature –200 ºC
Characterizable piezoelectric materials： 6mm、4mm、mm2、32、3m、422（Other types can be customized）
Characterizable elastic materials without piezoelectricity： All types can be customized

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Function Model Application

Function

The high and low temperature resonant ultrasound spectrometer can complete the test of the resonant ultrasound spectra of the solid samples under high and low temperature environments within the frequency range of 20 KHz – 4 MHz, and achieve the preliminary automatic identification of the resonance frequencies in the ultrasonic resonance spectrum. The minimum test temperature can reach -180ºC, and the maximum test temperature can reach 500ºC. The supporting inversion software can characterize the temperature-dependent characteristics of the material constans of various alloys, functional ceramics and piezoelectric crystals.

Model

Models	Band width	Temperature range	Maximum output	Preamplifier gain range	Characterizable materials	Manuals
XRUS-MT	10kHz-4MHz	Room temperature — 200ºC	90 V_p-p @ 1 MHz	12– 60 dB	Piezoelectric materials：6mm、4mm、mm2、32、3m、422 Elastic materials without piezoelectricity： All types can be customized
XRUS-HT	10kHz-4MHz	Room temperature — 500ºC	90 V_p-p @ 1 MHz	12– 60 dB	Piezoelectric materials：6mm、4mm、mm2、32、3m、422 Elastic materials without piezoelectricity： All types can be customized
XRUS-LHT	10kHz-4MHz	-180ºC — 300ºC	90 V_p-p @ 1 MHz	12– 60 dB	Piezoelectric materials：6mm、4mm、mm2、32、3m、422 Elastic materials without piezoelectricity： All types can be customized

Application

1. W. R. Xiao, A. L. Xiao, W. Y. Yang, L. G. Tang, G. S. Xu, W. Y. Luo, X. K. Zhang, Single-sample Characterization of Temperature-dependent Full Matrix Material Constants for Strongly Anisotropic [011]C Poled Pb(Mg1/3Nb2/3)O3–28PbTiO3 Single Crystals, IEEE Transactions on Instrumentation and Measurement, 74:6007413, 2025.

2. K. Zhang, A. L. Xiao,L. G. Tang, G. S. Xu, W. Y. Luo, Characterization of temperature-dependent full-matrix constants of [001]c-poled Mn-doped 28PIN-43PMN-29PT single crystals using one sample, Ceramics International, 51, 933-939, 2025.

3. A. L. Xiao, L. G. Tang, G. S. Xu, K. C. Wu, W. Y. Luo, Temperature-dependent characterization of full tensor properties of [111]c poled Mn-doped 28PIN-43PMN-29PT single crystals, Applied Physics Letters, 124, 212901, 2024.

Resonant ultrasound spectrometer

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